Training

DE-LOC: Design Validation and Debugging under Limited Observation and Control, Pre- and Post-Silicon for Mixed-Signal Systems

In the modern mixed-signal SoC design cycle, designers are frequently tasked with detecting and diagnosing behavioral discrepancies between design descriptions given at different levels of hierarchy, e.g. behavioral vs. transistor level descriptions …

TRAP: Test Generation Driven Classification of Analog/RF ICs Using Adaptive Probabilistic Clustering Algorithm

In production testing of analog/RF ICs, application of standard specification-based tests for IC classification is not always an attractive option due to the high costs and test times involved. In this paper, a new test generation algorithm for IC …