The test generation problem for analog/RF circuits has been largely intractable due to the fact that repetitive circuit simulation for test stimulus optimization is extremely time-consuming. As a consequence, it is difficult, if not impossible, to …
In production testing of analog/RF ICs, application of standard specification-based tests for IC classification is not always an attractive option due to the high costs and test times involved. In this paper, a new test generation algorithm for IC …
With trends in mixed-signal systems-on-chip indicating increasingly extreme scaling of device dimensions and higher levels of integration, the tasks of both design and device validation is becoming increasingly complex. Post-silicon validation of …
Post-silicon validation of RF/mixed-signal circuits is challenging due to the need to excite all possible operational modes of the DUT in order to establish equivalence between its specified and observed behaviors and to ensure that the DUT does not …
Due to the use of scaled technologies, high levels of integration and high speeds of today's mixed-signal SoCs, the problem of validating correct operation of the SoC under electrical bugs and that of debugging yield loss due to unmodeled …