The test generation problem for analog/RF circuits has been largely intractable due to the fact that repetitive circuit simulation for test stimulus optimization is extremely time-consuming. As a consequence, it is difficult, if not impossible, to …
In recent years, the use of highly parallelized and high-speed data links has exacerbated the problem of crosstalk coupling. Signals with high frequency components couple to and degrade the quality of signals in adjacent lines aggressively with …