Fault diagnosis

Atomic Model Learning: A Machine Learning Paradigm for Post Silicon Debug of RF/Analog Circuits

As RF design scales to the 28nm technology node and beyond, pre-silicon simulation and verification of complex mixed-signal/RF SoCs is becoming intractable due to the difficulties associated with simulating diverse electrical effects and design bugs. …

VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests

Post-silicon validation of RF/mixed-signal circuits is challenging due to the need to excite all possible operational modes of the DUT in order to establish equivalence between its specified and observed behaviors and to ensure that the DUT does not …