We present a methodology for algorithmic generation of test signals for thedetection and diagnosis of a variety of short and open-circuit defects in analogcircuits. Prior algorithms have focused on test generation for known short oropen defect …
In the modern mixed-signal SoC design cycle, designers are frequently tasked with detecting and diagnosing behavioral discrepancies between design descriptions given at different levels of hierarchy, e.g. behavioral vs. transistor level descriptions …
Post-silicon validation of RF/mixed-signal circuits is challenging due to the need to excite all possible operational modes of the DUT in order to establish equivalence between its specified and observed behaviors and to ensure that the DUT does not …