Defect detection

We present a methodology for algorithmic generation of test signals for thedetection and diagnosis of a variety of short and open-circuit defects in analogcircuits. Prior algorithms have focused on test generation for known short oropen defect …

In the modern mixed-signal SoC design cycle, designers are frequently tasked with detecting and diagnosing behavioral discrepancies between design descriptions given at different levels of hierarchy, e.g. behavioral vs. transistor level descriptions …