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B. J. Muldrey

Post Silicon Validation of Analog/Mixed Signal/RF Circuits and Systems: Recent Advances
Targeting Hardware Trojans in Mixed-Signal Circuits for Security
Adaptive Testing of Analog/RF Circuits Using Hardware Extracted FSM Models
Trojan Detection in Digital Systems Using Current Sensing of Pulse Propagation in Logic Gates
TRAP: Test Generation Driven Classification of Analog/RF ICs Using Adaptive Probabilistic Clustering Algorithm
Challenge Engineering and Design of Analog Push Pull Amplifier Based Physically Unclonable Function for Hardware Security
Atomic Model Learning: A Machine Learning Paradigm for Post Silicon Debug of RF/Analog Circuits
VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests

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